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Unbeatable in automated terahertz measurement

Automated measurement solution for coating thickness measurement of organic and dielectric single and multilayers as well as material analysis with terahertz waves

Availability depending on region and country


  • Market-leading measurement performance: Up to 6 THz bandwidth* for highest precision and repeatability
  • Patented Clean-Trace Technology: Continuous dry air purging for unadulterated measurement results
  • 3D scanner: High-precision positioning even on round surfaces and complex geometries
  • Faster than any vibration. Precise measurement results even in harsh environments thanks to uniquely high sampling rate of 1.6 kHz*
  • Easy integration: Hardware and software designed for robot and control systems
  • High reliability: Robust, low maintenance, developed for 24/7 operation
  • Low maintenance. Less wear and tear due to electro-optical measurement

*Depending on configuration


  • Spot size: ⌀ 1 mm
  • Bandwidth: Up to 6 THz*
  • Sampling rate: 1.6 kHz*
  • Measuring time: ⌀ 1 s
  • Integration, remote control, and data export via fieldbus system
  • Thickness of the layer(s): 10 μm up to several millimeters
  • Number of layers: Up to 7 (depending on the material)
  • Measuring distance: 7 cm
  • Measuring precision: Up to 1 μm, from 100 μm layer thickness up to 1% (depending on the application)
  • Repeatability: < 0.1 μm

*Depending on configuration


  • Coating thickness measurement of organic single and multiple layers on plastic or metal substrates
  • Layer thickness measurement of dry, wet and soft coatings
  • Contactless conductivity measurement (e.g. solar cells, wafer 2DEG, graphene)
  • Quality control and non-destructive testing (NDT), imaging through the material, hidden defect detection, spectroscopic measurements
  • Material characterization and development

More precise, more accurate and faster. Designed for maximum uptime, the robust TERASCOPE® features up to 6 THz bandwidth for market-leading measurement performance. Specifically designed for measuring multi-layer systems, the automated measurement system can detect each individual layer and determine its properties – contactless, non-destructively and precisely. And it does so fully automatically in just a single work step.

Thanks to the extremely high sampling rate, the TERASCOPE® measures independently of external vibrations and supplies measurement results within a super-short time, regardless of the base material, no matter what industry. Integrate the TERASCOPE® easily into your quality assurance process and work with worldwide unique precision, accuracy and speed.


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How does the terahertz measurement work?

The TERASCOPE® uses terahertz waves in a broad frequency range from up to 6 THz*. With a wavelength of less than 1 mm the terahertz waves are shorter than microwaves but longer than visible light. The special feature of THz waves is that they can penetrate numerous organic and dielectric layers. Each individual layer within a multilayer system can be detected separately.

The terahertz waves are generated in the measuring head by an optoelectronic unit with a laser. This emits ultrashort terahertz pulses that is sent to the sample. These pulses penetrate the different layers. At the transitions between the layers, the waves are partially reflected. These echo pulses arrive at the detector with characteristic time differences. Since each layer and each material has specific absorption spectra, individual layers and their layer thickness can be precisely determined from the signal characteristics, and other parameters such as homogeneity and porosity can be inferred.

*Depending on configuration

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