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์ฃผ์‹ํšŒ์‚ฌ ํ—ฌ๋ฌดํŠธ ํ”ผ์…” ์ฝ”๋ฆฌ์•„๋Š” ๋‹ค์–‘ํ•œ ์‚ฐ์—… ๋ถ„์•ผ์˜ ํŠน์ • ์š”๊ตฌ์‚ฌํ•ญ์— ๋Œ€ํ•œ ๊ด‘๋ฒ”์œ„ํ•œ ํ•ด๊ฒฐ์ฑ…์„ ์ œ๊ณตํ•ฉ๋‹ˆ๋‹ค. ์—ฌ๊ธฐ์„œ ์ธก์ • ์ž‘์—…์— ์ ํ•ฉํ•œ ์ œํ’ˆ์„ ๊ฒ€์ƒ‰ ํ•˜์„ธ์š”.

๋กœ๋”ฉ ์ค‘ โ€ฆ
๋กœ๋”ฉ ์ค‘ โ€ฆ
์ œํ’ˆ ๊ฒ€์ƒ‰

์›ํ•˜๋Š” ์ œํ’ˆ๋ช…์„ ์ด๋ฆ„์„ ์ž…๋ ฅํ•˜๋ฉด ์ œ์•ˆ๋œ ๊ฒฐ๊ณผ๋ฅผ ํ†ตํ•ด ๋ฐ”๋กœ ํ•ด๋‹น ์ œํ’ˆ์œผ๋กœ ์ด๋™ํ•ฉ๋‹ˆ๋‹ค.

๋ชจ๋“  ์ œํ’ˆ ํ‘œ์‹œ
๋ณด๊ธฐ / ์ˆจ๊ธฐ๊ธฐ

XRF ๊ธฐ๊ธฐ๋ฅผ ์„ ํƒํ•˜๋Š” ๋ฐฉ๋ฒ•

An XRF analyzer must be equipped with components which meet the specific requirements of the measurement task.

์ „์šฉ ์ธก์ • ์ž‘์—…์— ์ ํ•ฉํ•œ ์ธก์ • ์žฅ์น˜๋ฅผ ์„ ํƒํ•˜์‹ญ์‹œ์˜ค.

ํˆฌ์ž ๋น„์šฉ์€ ํ•ญ์ƒ ์ค‘์š”ํ•œ ์ธก๋ฉด์ž…๋‹ˆ๋‹ค. ๋ฌผ๋ก  ์˜ˆ์‚ฐ๋„ XRF ๋ถ„์„๊ธฐ๋ฅผ ์„ ํƒํ•  ๋•Œ ์ค‘์š”ํ•œ ์—ญํ• ์„ ํ•ฉ๋‹ˆ๋‹ค. ๊ทธ๋Ÿฌ๋‚˜ ๊ฐ€์žฅ ๋น„์‹ผ ์ธก์ • ์žฅ์น˜๊ฐ€ ๋ชจ๋“  ์ธก์ • ์ž‘์—…์— ์ž๋™์œผ๋กœ ๊ฐ€์žฅ ์ ํ•ฉํ•œ ๊ฒƒ์€ ์•„๋‹™๋‹ˆ๋‹ค. ์ด ๊ธฐ์‚ฌ์—์„œ ์ „์šฉ ์ธก์ • ์ž‘์—…์— ์ตœ์ ์˜ ์†”๋ฃจ์…˜์„ ์ œ๊ณตํ•˜๋Š” ์˜ฌ๋ฐ”๋ฅธ ์ธก์ • ์žฅ์น˜๋ฅผ ์„ ํƒํ•˜๋Š” ๋ฐฉ๋ฒ•์„ ์•Œ์•„๋ณด์„ธ์š”.

๋‹ค์šด๋กœ๋“œ

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